Study of leakage current in GaN junction field-effect transistor under heavy ion radiation
Jianan Song; Zequan Chen; Yuxin Du; Yixin Xiong; Rongming Chu; Miaomiao Jin
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Applied Physics Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0313387
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Cite this source
Jianan Song; Zequan Chen; Yuxin Du; Yixin Xiong; Rongming Chu; Miaomiao Jin. Study of leakage current in GaN junction field-effect transistor under heavy ion radiation. Applied Physics Letters. 2026-03-23. https://doi.org/10.1063/5.0313387