Integrating AI Agents with Classical Reliability Assessment via LLMs of Semiconductor Lasers
Chizhi Chris Zhang; Tong Wang; Jian Jiang
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 7th International Conference on System Reliability and Safety Engineering (SRSE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/srse67406.2025.11357401
The original publisher provides the full text and its access options.
Cite this source
Chizhi Chris Zhang; Tong Wang; Jian Jiang. Integrating AI Agents with Classical Reliability Assessment via LLMs of Semiconductor Lasers. 2025 7th International Conference on System Reliability and Safety Engineering (SRSE). 2025-11-20. https://doi.org/10.1109/srse67406.2025.11357401