Influence of the Initial Microstructure of Al-chip-metallization on reliability of power semiconductor
Shilin Zhao; Erxian Yao; Yan Tong; Chunbiao Wang; Yang Chen; Yang Xu
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Journal of Physics: Conference Series
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1742-6596/3043/1/012005
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Cite this source
Shilin Zhao; Erxian Yao; Yan Tong; Chunbiao Wang; Yang Chen; Yang Xu. Influence of the Initial Microstructure of Al-chip-metallization on reliability of power semiconductor. Journal of Physics: Conference Series. 2025-06-01. https://doi.org/10.1088/1742-6596/3043/1/012005