Pulsed Characterization of 1.2 kV SiC Optically Controlled Transistor With Reverse Conducting Performance
Xi Wang; Yulei Zhang; Yuxi Wan; Juan Xiong; Lechen Liu; Xuhui Pu; Chao Zhang; Hongbin Pu; Zhiming Chen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2025.3593224
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Cite this source
Xi Wang; Yulei Zhang; Yuxi Wan; Juan Xiong; Lechen Liu; Xuhui Pu; Chao Zhang; Hongbin Pu; Zhiming Chen. Pulsed Characterization of 1.2 kV SiC Optically Controlled Transistor With Reverse Conducting Performance. IEEE Electron Device Letters. 2025-10. https://doi.org/10.1109/led.2025.3593224