Compact Modeling of a Charge-Accumulation-Based Dual-Gate Feedback Field-Effect Transistor for Circuit-Level Analysis
Jaewon Lee; Min-Woo Kwon
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of the Electron Devices Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jeds.2026.3730701
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Cite this source
Jaewon Lee; Min-Woo Kwon. Compact Modeling of a Charge-Accumulation-Based Dual-Gate Feedback Field-Effect Transistor for Circuit-Level Analysis. IEEE Journal of the Electron Devices Society. 2026. https://doi.org/10.1109/jeds.2026.3730701