Temperature Metrology in Extreme Manufacturing Environments at NIST
Brandon Lane; David Deisenroth; Sergey Mekhontsev; Eric Whitenton
- Published
- Publisher
- Bureau International des Poids et Mesures (BIPM)
- Journal / collection
- 150th anniversary of the Metre Convention — From Units to the Universe
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.59161/huap1239
The original publisher provides the full text and its access options.
Cite this source
Brandon Lane; David Deisenroth; Sergey Mekhontsev; Eric Whitenton. Temperature Metrology in Extreme Manufacturing Environments at NIST. 150th anniversary of the Metre Convention — From Units to the Universe. 2025. https://doi.org/10.59161/huap1239