Tuning the charge trapping properties of organic field-effect transistor memories via a co-evaporated bulk heterojunction approach
Yonghao Yang; Hao Yu; Ye Chen; Wen Li; Wei Shi; Wei Huang; Mingdong Yi
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Surfaces and Interfaces
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.surfin.2025.106493
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Cite this source
Yonghao Yang; Hao Yu; Ye Chen; Wen Li; Wei Shi; Wei Huang; Mingdong Yi. Tuning the charge trapping properties of organic field-effect transistor memories via a co-evaporated bulk heterojunction approach. Surfaces and Interfaces. 2025-05. https://doi.org/10.1016/j.surfin.2025.106493