Experimental Investigation of Terrestrial-Neutron-Induced Single-Event Burnout on Carrier Stored Trench-Gate Bipolar Transistor (CSTBT)
Xiao-Feng Huang; Chen-Ming Li; Li-Hua Mo; Zhi-Liang Hu; Hai-Bin Wang
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Nuclear Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tns.2026.3716340
The original publisher provides the full text and its access options.
Cite this source
Xiao-Feng Huang; Chen-Ming Li; Li-Hua Mo; Zhi-Liang Hu; Hai-Bin Wang. Experimental Investigation of Terrestrial-Neutron-Induced Single-Event Burnout on Carrier Stored Trench-Gate Bipolar Transistor (CSTBT). IEEE Transactions on Nuclear Science. 2026-09. https://doi.org/10.1109/tns.2026.3716340