Statistical control of extreme events in a semiconductor VCSEL via polarization-engineered optical feedback
Tao Wang; Zhibo Li; Yixing Ma; Juncheng Huang; Yiheng Li; Zhicong Yu; Shuiying Xiang; Giancarlo Ruocco; Yue Hao
- Published
- Publisher
- Optica Publishing Group
- Journal / collection
- Optics Express
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1364/oe.610519
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Cite this source
Tao Wang; Zhibo Li; Yixing Ma; Juncheng Huang; Yiheng Li; Zhicong Yu; Shuiying Xiang; Giancarlo Ruocco; Yue Hao. Statistical control of extreme events in a semiconductor VCSEL via polarization-engineered optical feedback. Optics Express. 2026-09-16. https://doi.org/10.1364/oe.610519