Study of Combined Effect of Field-Plate Structure and Defects in Channel-Passivated a-IGZO Thin-Film Transistor
Chih-Chieh Hsu; Zheng-Xun Xie; Wun-Ciang Jhang; Shou-An Hu; Kai-Zer Xiao; Srinivasa Rao Karumuri; Henry J. H. Chen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2025.3638309
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Cite this source
Chih-Chieh Hsu; Zheng-Xun Xie; Wun-Ciang Jhang; Shou-An Hu; Kai-Zer Xiao; Srinivasa Rao Karumuri; Henry J. H. Chen. Study of Combined Effect of Field-Plate Structure and Defects in Channel-Passivated a-IGZO Thin-Film Transistor. IEEE Transactions on Electron Devices. 2026-01. https://doi.org/10.1109/ted.2025.3638309