POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES
Professor, School of Computer Application & Technology & Dean, Research Career Point University, Kota, India; Prof. (Dr.) Abid Hussain
- Published
- Publisher
- IJARCS International Journal of Advanced Research in Computer Science
- Journal / collection
- international journal of advanced research in computer science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.26483/ijarcs.v16i4.7321
The original publisher provides the full text and its access options.
Cite this source
Professor, School of Computer Application & Technology & Dean, Research Career Point University, Kota, India; Prof. (Dr.) Abid Hussain. POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. international journal of advanced research in computer science. 2025-08-20. https://doi.org/10.26483/ijarcs.v16i4.7321