Noninvasive van der Waals Interface Integrations for Intrinsic 2D Semiconductor Characterization
Mingrui Liu; Yunan Wang; Mengyu Hong; Jinsen Shang; Yifang Liu; He Jiang; Xianghui Xiong; Shucao Lu; Xiankun Zhang; Zheng Zhang; Yue Zhang
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Nano Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acs.nanolett.5c03799
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Cite this source
Mingrui Liu; Yunan Wang; Mengyu Hong; Jinsen Shang; Yifang Liu; He Jiang; Xianghui Xiong; Shucao Lu; Xiankun Zhang; Zheng Zhang; Yue Zhang. Noninvasive van der Waals Interface Integrations for Intrinsic 2D Semiconductor Characterization. Nano Letters. 2025-09-25. https://doi.org/10.1021/acs.nanolett.5c03799