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Research literature / Conference paper

Piecewise Linear State-Space Modeling and Dimensioning of Protection Circuits for Electronic Semiconductor Fuses

Bastian Eisenmann; Martin Baumann; Christoph Mayer; Marcelo Lobo Heldwein

Published
Publisher
IEEE
Journal / collection
2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/vtc2025-spring65109.2025.11174635

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Bastian Eisenmann; Martin Baumann; Christoph Mayer; Marcelo Lobo Heldwein. Piecewise Linear State-Space Modeling and Dimensioning of Protection Circuits for Electronic Semiconductor Fuses. 2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring). 2025-06-17. https://doi.org/10.1109/vtc2025-spring65109.2025.11174635

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