Beam collimation and quality enhancement of edge-emitting semiconductor lasers using a single-chip metasurface
Yujin Chen; ChunZheng Wang; Jianshe Ma; Ping Su
- Published
- Publisher
- SPIE
- Journal / collection
- AOPC 2025: Computational Imaging Technology
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3085725
The original publisher provides the full text and its access options.
Cite this source
Yujin Chen; ChunZheng Wang; Jianshe Ma; Ping Su. Beam collimation and quality enhancement of edge-emitting semiconductor lasers using a single-chip metasurface. AOPC 2025: Computational Imaging Technology. 2025-10-28. https://doi.org/10.1117/12.3085725