Comparative Analysis of Surface Electrical Potential Distribution Across Semiconductor Wafers Using Advanced 3D Simulation Models
Aaron Maurer; Minu Balakrishnan
- Published
- Publisher
- Elaris Publications Private Limited
- Journal / collection
- Elaris Computing Nexus
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.65148/ecn/2025016
The original publisher provides the full text and its access options.
Cite this source
Aaron Maurer; Minu Balakrishnan. Comparative Analysis of Surface Electrical Potential Distribution Across Semiconductor Wafers Using Advanced 3D Simulation Models. Elaris Computing Nexus. 2025-10-12. https://doi.org/10.65148/ecn/2025016