Molecular Semiconductor-Induced Deep Trapping Enables Ultrahigh-Performance Dielectric Elastomers
Xiaorong Dou; Huiyao Zhao; Jiahao Li; Shaodong Duan; Jianbo Wu; Jie Mao; Zhi-Min Dang
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Nano
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsnano.5c17142
The original publisher provides the full text and its access options.
Cite this source
Xiaorong Dou; Huiyao Zhao; Jiahao Li; Shaodong Duan; Jianbo Wu; Jie Mao; Zhi-Min Dang. Molecular Semiconductor-Induced Deep Trapping Enables Ultrahigh-Performance Dielectric Elastomers. ACS Nano. 2026-02-23. https://doi.org/10.1021/acsnano.5c17142