Performance Characterization of Dual-Metal Triple- Gate-Dielectric (DM_TGD) Tunnel Field Effect Transistor (TFET)
Tan Chun Fui; Ajay Kumar Singh; Lim Way Soong
- Published
- Publisher
- Zeal Press
- Journal / collection
- International Journal of Robotics and Automation Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.31875/2409-9694.2021.08.8
The original publisher provides the full text and its access options.
Cite this source
Tan Chun Fui; Ajay Kumar Singh; Lim Way Soong. Performance Characterization of Dual-Metal Triple- Gate-Dielectric (DM_TGD) Tunnel Field Effect Transistor (TFET). International Journal of Robotics and Automation Technology. 2025-10-02. https://doi.org/10.31875/2409-9694.2021.08.8