Linearity metrics of pre-matched AlGaN/GaN RF transistor: multi-tone simulation and measurement analysis
José Anderson Silva Dos Santos; Julien Alleman; Margot Leventoux; Pierre Medrel; Christophe Chang; Raphael Sommet; Fabien Courrèges; Jean-Christophe Nallatamby
- Published
- Publisher
- Cambridge University Press (CUP)
- Journal / collection
- International Journal of Microwave and Wireless Technologies
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1017/s1759078726103699
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Cite this source
José Anderson Silva Dos Santos; Julien Alleman; Margot Leventoux; Pierre Medrel; Christophe Chang; Raphael Sommet; Fabien Courrèges; Jean-Christophe Nallatamby. Linearity metrics of pre-matched AlGaN/GaN RF transistor: multi-tone simulation and measurement analysis. International Journal of Microwave and Wireless Technologies. 2026-08-10. https://doi.org/10.1017/s1759078726103699