Ratcheting induced crack growth in semiconductor devices
Chenghai Li; Shao-Chen Tseng; Yu Zhou; Chieh-Hao Hsu; Wei-Hsiang Tu; Kuo-Chin Chang; Jun He; Zhigang Suo
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Extreme Mechanics Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.eml.2025.102399
The original publisher provides the full text and its access options.
Cite this source
Chenghai Li; Shao-Chen Tseng; Yu Zhou; Chieh-Hao Hsu; Wei-Hsiang Tu; Kuo-Chin Chang; Jun He; Zhigang Suo. Ratcheting induced crack growth in semiconductor devices. Extreme Mechanics Letters. 2025-11. https://doi.org/10.1016/j.eml.2025.102399