Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories
Jessica Hautz; Andreas Klemmt; Lars Mönch
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Flexible Services and Manufacturing Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10696-025-09630-9
The original publisher provides the full text and its access options.
Cite this source
Jessica Hautz; Andreas Klemmt; Lars Mönch. Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories. Flexible Services and Manufacturing Journal. 2025-07-14. https://doi.org/10.1007/s10696-025-09630-9