Study on Single Event Effects in High-Voltage Silicon Power Semiconductor Devices
Mingmin Huang; Huan Li; Ailin Qiu; Yichu Qin; Xiaoping Dong; Dongyang Wang; Yao Ma; Qiang Yu
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/edssc64492.2025.11183452
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Cite this source
Mingmin Huang; Huan Li; Ailin Qiu; Yichu Qin; Xiaoping Dong; Dongyang Wang; Yao Ma; Qiang Yu. Study on Single Event Effects in High-Voltage Silicon Power Semiconductor Devices. 2025 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSS). 2025-06-13. https://doi.org/10.1109/edssc64492.2025.11183452