Defect-Induced Phonon Redistribution at Semiconductor Heterointerfaces
Zihao Qin; Han-Hsuan Wu; Francisco Guzman; Fenghui Gong; Xingxu Yan; Yifeng Huang; Xiaoqing Pan
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy and Microanalysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mam/ozag053.599
The original publisher provides the full text and its access options.
Cite this source
Zihao Qin; Han-Hsuan Wu; Francisco Guzman; Fenghui Gong; Xingxu Yan; Yifeng Huang; Xiaoqing Pan. Defect-Induced Phonon Redistribution at Semiconductor Heterointerfaces. Microscopy and Microanalysis. 2026-07. https://doi.org/10.1093/mam/ozag053.599