Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches

Tong Ru; Hao Li; Yihui Li; Jianwen Wu; Chao Liu; Ruiqiang Lu; Zhiming Liang; Yongjie Chen; Zheng Wu; Bingfeng Li; Junjie Li

Published
Publisher
IEEE
Journal / collection
2025 IEEE International Conference on Robotics and Biomimetics (ROBIO)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/robio66223.2025.11376108

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Tong Ru; Hao Li; Yihui Li; Jianwen Wu; Chao Liu; Ruiqiang Lu; Zhiming Liang; Yongjie Chen; Zheng Wu; Bingfeng Li; Junjie Li. Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches. 2025 IEEE International Conference on Robotics and Biomimetics (ROBIO). 2025-12-03. https://doi.org/10.1109/robio66223.2025.11376108

Download RIS