Semiconductor probe card proactive maintenance using graph self-supervised learning and an empirical study
Tran Hong Van Nguyen; Chen-Fu Chien
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Computers & Industrial Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.cie.2025.110955
The original publisher provides the full text and its access options.
Cite this source
Tran Hong Van Nguyen; Chen-Fu Chien. Semiconductor probe card proactive maintenance using graph self-supervised learning and an empirical study. Computers & Industrial Engineering. 2025-05. https://doi.org/10.1016/j.cie.2025.110955