Manufacturing Process Root Cause Analysis With Graph Neural Networks
Akash Gaurav; Muralidhara VN
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Conference on Device Technologies for Diversified Applications (DTDA)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/dtda64656.2025.11623111
The original publisher provides the full text and its access options.
Cite this source
Akash Gaurav; Muralidhara VN. Manufacturing Process Root Cause Analysis With Graph Neural Networks. 2025 IEEE International Conference on Device Technologies for Diversified Applications (DTDA). 2025-10. https://doi.org/10.1109/dtda64656.2025.11623111