Emerging thermal metrology for ultra-wide bandgap semiconductor devices
D. Myren; F. Vásquez-Aza; J. S. Lundh; M. J. Tadjer; G. Pavlidis
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Applied Physics Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0256723
The original publisher provides the full text and its access options.
Cite this source
D. Myren; F. Vásquez-Aza; J. S. Lundh; M. J. Tadjer; G. Pavlidis. Emerging thermal metrology for ultra-wide bandgap semiconductor devices. Applied Physics Letters. 2025-05-19. https://doi.org/10.1063/5.0256723