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Research literature / Conference paper

Anomalyspy: A Generative Defect Localization in Semiconductor Packages, with X-Ray Microscopy

Riko I Made; Pawan Kumar; Pablo Quijano Velasco; Ng Chee Koon; Leong Chang Jie

Published
Publisher
IEEE
Journal / collection
2025 IEEE 27th Electronics Packaging Technology Conference (EPTC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/eptc67330.2025.11392584

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Riko I Made; Pawan Kumar; Pablo Quijano Velasco; Ng Chee Koon; Leong Chang Jie. Anomalyspy: A Generative Defect Localization in Semiconductor Packages, with X-Ray Microscopy. 2025 IEEE 27th Electronics Packaging Technology Conference (EPTC). 2025-12-02. https://doi.org/10.1109/eptc67330.2025.11392584

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