Graph-based contrastive learning for self-supervised semiconductor wafer defect detection
Muhammad Awais; Octavian Adrian Postolache; Sancho Moura Oliveira
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Intelligent Manufacturing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10845-026-02906-3
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Cite this source
Muhammad Awais; Octavian Adrian Postolache; Sancho Moura Oliveira. Graph-based contrastive learning for self-supervised semiconductor wafer defect detection. Journal of Intelligent Manufacturing. 2026-07-04. https://doi.org/10.1007/s10845-026-02906-3