Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies (2025 Update)
Michael Kögel; Sebastian Brand; Frank Altmann
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2025tp00x1
The original publisher provides the full text and its access options.
Cite this source
Michael Kögel; Sebastian Brand; Frank Altmann. Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies (2025 Update). International Symposium for Testing and Failure Analysis. 2025-11-16. https://doi.org/10.31399/asm.cp.istfa2025tp00x1