Accelerated Circuit Simulations and Standard Cell Library Characterization through Neural Network-based Transistor Modeling
Rodion Novkin; Hussam Amrouch
- Published
- Publisher
- Springer Science and Business Media LLC
- Research area
- AI & compute
- Source type
- Preprint / posted paper
- DOI
- 10.21203/rs.3.rs-8902258/v1
This is a preprint or other posted paper. Check the original source for its review and publication status.
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Cite this source
Rodion Novkin; Hussam Amrouch. Accelerated Circuit Simulations and Standard Cell Library Characterization through Neural Network-based Transistor Modeling. Springer Science and Business Media LLC. 2026-03-17. https://doi.org/10.21203/rs.3.rs-8902258/v1