Impact of Grain Boundaries on Zero-Temperature Coefficient Characteristics in a 3D-Stacked Transistor
Kyung Hee Kim; In Man Kang; Young Jun Yoon; Kibeom Kim
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/electronics14173494
The original publisher provides the full text and its access options.
Cite this source
Kyung Hee Kim; In Man Kang; Young Jun Yoon; Kibeom Kim. Impact of Grain Boundaries on Zero-Temperature Coefficient Characteristics in a 3D-Stacked Transistor. Electronics. 2025-08-31. https://doi.org/10.3390/electronics14173494