SEMICONDUCTOR RELIABILITY CHALLENGES IN ELECTRIC AND AUTONOMOUS VEHICLES: A SYSTEMATIC REVIEW
Quazi Taif Sadat
- Published
- Publisher
- Academic Publications
- Journal / collection
- International Journal of Applied Mathematics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.12732/ijam.v38i5.1611
The original publisher provides the full text and its access options.
Cite this source
Quazi Taif Sadat. SEMICONDUCTOR RELIABILITY CHALLENGES IN ELECTRIC AND AUTONOMOUS VEHICLES: A SYSTEMATIC REVIEW. International Journal of Applied Mathematics. 2025-10-02. https://doi.org/10.12732/ijam.v38i5.1611