Trends and Future Prospects of International Standards for Semiconductor Optoelectronic Devices
Society for Standards, Certification and Safety; Jong-In Shim; Dong-Soo Shin; Sang-Geun Lee
- Published
- Publisher
- Society for Standards Certification and Safety
- Journal / collection
- Society for Standards Certification and Safety
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.34139/jscs.2026.16.3.16
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Cite this source
Society for Standards, Certification and Safety; Jong-In Shim; Dong-Soo Shin; Sang-Geun Lee. Trends and Future Prospects of International Standards for Semiconductor Optoelectronic Devices. Society for Standards Certification and Safety. 2026-09-30. https://doi.org/10.34139/jscs.2026.16.3.16