A High-Accuracy DEVICE AI Model for 17 N/P-Channel Transistor Families Across LV, SRAM, MV, and HV at 40 nm Node
Peter Liu; Yi-Chuen Eng; Daiki Qin; Le Li; Carl Ma; RR Zhu; Wenhao Wu; Yuri Ma; Rumeng Qiu; Cloud Wang; Chia-Yen Li
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/edtm65772.2026.11497815
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Cite this source
Peter Liu; Yi-Chuen Eng; Daiki Qin; Le Li; Carl Ma; RR Zhu; Wenhao Wu; Yuri Ma; Rumeng Qiu; Cloud Wang; Chia-Yen Li. A High-Accuracy DEVICE AI Model for 17 N/P-Channel Transistor Families Across LV, SRAM, MV, and HV at 40 nm Node. 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2026-03-01. https://doi.org/10.1109/edtm65772.2026.11497815