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Research literature / Conference paper

Nonlinear optical metrology of electronic interfaces for advanced semiconductor devices

Rishabh Mishra; Alvin Mo; Syed Hamad Ullah Shah; Shona McNab; Murad J. Tayebjee; Bram Hoex; Michael P. Nielsen

Published
Publisher
SPIE
Journal / collection
Ultrafast Phenomena and Nanophotonics XXX
Research area
Semiconductors
Source type
Conference paper
DOI
10.1117/12.3079024

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Rishabh Mishra; Alvin Mo; Syed Hamad Ullah Shah; Shona McNab; Murad J. Tayebjee; Bram Hoex; Michael P. Nielsen. Nonlinear optical metrology of electronic interfaces for advanced semiconductor devices. Ultrafast Phenomena and Nanophotonics XXX. 2026-03-05. https://doi.org/10.1117/12.3079024

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