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Research literature / Journal article

Degradation Detection of Power Semiconductor Based on Real-time Vds-on Monitoring Techniques

Hyeonho Jeong; Sanghyun Moon; Suwoong Eo; Hyun-Woo Jung; Dae-Un Sung; Jiwon Yoo

Published
Publisher
The Korean Institute of Power Electronics
Journal / collection
THE TRANSACTIONS OF KOREAN INSTITUTE OF POWER ELECTRONICS
Research area
Semiconductors
Source type
Journal article
DOI
10.6113/tkpe.2025.30.6.521

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Hyeonho Jeong; Sanghyun Moon; Suwoong Eo; Hyun-Woo Jung; Dae-Un Sung; Jiwon Yoo. Degradation Detection of Power Semiconductor Based on Real-time Vds-on Monitoring Techniques. THE TRANSACTIONS OF KOREAN INSTITUTE OF POWER ELECTRONICS. 2025-12-31. https://doi.org/10.6113/tkpe.2025.30.6.521

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