A silicon-based ion trap chip protected from semiconductor charging
Daun Chung; Kwangyeul Choi; Woojun Lee; Chiyoon Kim; Hosung Shon; Jeonghyun Park; Beomgeun Cho; Kyungmin Lee; Suhan Kim; Seungwoo Yoo; Uihwan Jung; Changhyun Jung; Jiyong Kang; Kyunghye Kim; Roberts Berkis; Tracy Northup; Dong-Il ‘Dan’ Cho; Taehyun Kim
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Quantum Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/2058-9565/add04c
The original publisher provides the full text and its access options.
Cite this source
Daun Chung; Kwangyeul Choi; Woojun Lee; Chiyoon Kim; Hosung Shon; Jeonghyun Park; Beomgeun Cho; Kyungmin Lee; Suhan Kim; Seungwoo Yoo; Uihwan Jung; Changhyun Jung; Jiyong Kang; Kyunghye Kim; Roberts Berkis; Tracy Northup; Dong-Il ‘Dan’ Cho; Taehyun Kim. A silicon-based ion trap chip protected from semiconductor charging. Quantum Science and Technology. 2025-05-02. https://doi.org/10.1088/2058-9565/add04c