Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress
Changjun Li; Jinjun Cheng; Xiaoxu Chu; Haizhen Zhu; Fawen Xu
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/access.2026.3683376
The original publisher provides the full text and its access options.
Cite this source
Changjun Li; Jinjun Cheng; Xiaoxu Chu; Haizhen Zhu; Fawen Xu. Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress. IEEE Access. 2026. https://doi.org/10.1109/access.2026.3683376