Insulating tip for scanning near-field microwave microscopes: Application to van der Waals semiconductor imaging
Kohei Yamasue; Koki Takano; Taiyo Ishizuka; Yasuo Cho
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Applied Physics Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0268493
The original publisher provides the full text and its access options.
Cite this source
Kohei Yamasue; Koki Takano; Taiyo Ishizuka; Yasuo Cho. Insulating tip for scanning near-field microwave microscopes: Application to van der Waals semiconductor imaging. Applied Physics Letters. 2025-06-16. https://doi.org/10.1063/5.0268493