AlGaN/GaN heterojunction field effect transistor structure integrated photoelectrode probe with optical artifact suppression function
Xin Cao; Yanyuan Ding; Xi'en Yang; Wenbo Zhao; Xiaodong Li; Ye Wen; Yang Li; Xilei Huang; Zeyi Li; Jiefeng Weng; Baijun Zhang
- Published
- Publisher
- Springer Science and Business Media LLC
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.21203/rs.3.rs-10147214/v1
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Cite this source
Xin Cao; Yanyuan Ding; Xi'en Yang; Wenbo Zhao; Xiaodong Li; Ye Wen; Yang Li; Xilei Huang; Zeyi Li; Jiefeng Weng; Baijun Zhang. AlGaN/GaN heterojunction field effect transistor structure integrated photoelectrode probe with optical artifact suppression function. Springer Science and Business Media LLC. 2026-07-03. https://doi.org/10.21203/rs.3.rs-10147214/v1