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Fast Multiscale Thermal Simulation of Large SOCs down to Sub-Nanometer Transistor Channel Detail through Iterative Selective Resolution Refinement

Bjorn Vermeersch; Herman Oprins; Geert Hellings; James Myers

Published
Publisher
IEEE
Journal / collection
2026 42nd Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.23919/semi-therm71268.2026.11573112

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Bjorn Vermeersch; Herman Oprins; Geert Hellings; James Myers. Fast Multiscale Thermal Simulation of Large SOCs down to Sub-Nanometer Transistor Channel Detail through Iterative Selective Resolution Refinement. 2026 42nd Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM). 2026-03-09. https://doi.org/10.23919/semi-therm71268.2026.11573112

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