Transient analysis of steep subthreshold slope gate-controlled carrier-injection silicon-on-insulator transistor for ultra-low power applications
Haruki Yonezaki; Yukihiko Yamazaki; Kyouichiro Suzuki; Jiro Ida; Takayuki Mori
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Japanese Journal of Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.35848/1347-4065/ae3770
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Cite this source
Haruki Yonezaki; Yukihiko Yamazaki; Kyouichiro Suzuki; Jiro Ida; Takayuki Mori. Transient analysis of steep subthreshold slope gate-controlled carrier-injection silicon-on-insulator transistor for ultra-low power applications. Japanese Journal of Applied Physics. 2026-02-09. https://doi.org/10.35848/1347-4065/ae3770