Scaling Effects of Transistor Leakage Current and IR Drop on 1T1R Memory Arrays
Junren Chen; Giacomo Indiveri
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Symposium on Circuits and Systems (ISCAS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iscas56072.2025.11043970
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Cite this source
Junren Chen; Giacomo Indiveri. Scaling Effects of Transistor Leakage Current and IR Drop on 1T1R Memory Arrays. 2025 IEEE International Symposium on Circuits and Systems (ISCAS). 2025-05-25. https://doi.org/10.1109/iscas56072.2025.11043970