Interfacial stability and oxygen-vacancy-mediated bonding in YSZ/Si ceramic/semiconductor heterointerfaces
Yinghao Wang; Yanyan Zhang; Zhiwen Gan; Jie Shen; Wang Liu; Dongliang Zhang; Zhiyin Gan; Sheng Liu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Ceramics International
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.ceramint.2026.09.384
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Cite this source
Yinghao Wang; Yanyan Zhang; Zhiwen Gan; Jie Shen; Wang Liu; Dongliang Zhang; Zhiyin Gan; Sheng Liu. Interfacial stability and oxygen-vacancy-mediated bonding in YSZ/Si ceramic/semiconductor heterointerfaces. Ceramics International. 2026-09. https://doi.org/10.1016/j.ceramint.2026.09.384