Security Vulnerabilities of Semiconductor Memories
Pravineeth Edara; Biresh K. Joardar; Zakia T. Tisha; Ujjwal Guin; Habib Ur Rahman; Biswajit Ray
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE 44th VLSI Test Symposium (VTS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/vts69484.2026.11563388
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Cite this source
Pravineeth Edara; Biresh K. Joardar; Zakia T. Tisha; Ujjwal Guin; Habib Ur Rahman; Biswajit Ray. Security Vulnerabilities of Semiconductor Memories. 2026 IEEE 44th VLSI Test Symposium (VTS). 2026-04-27. https://doi.org/10.1109/vts69484.2026.11563388