Mel spectrogram–driven deep learning framework for acoustic emission-based manufacturing monitoring in wire arc additive manufacturing
Fei Gao; Yishu Chen; Jing Lin; Yinmin Zhu; Yonghao Miao; Jinghui Tian
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Journal of Reliability Science and Engineering
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1088/3050-2454/ae5498
The original publisher provides the full text and its access options.
Cite this source
Fei Gao; Yishu Chen; Jing Lin; Yinmin Zhu; Yonghao Miao; Jinghui Tian. Mel spectrogram–driven deep learning framework for acoustic emission-based manufacturing monitoring in wire arc additive manufacturing. Journal of Reliability Science and Engineering. 2026-03-31. https://doi.org/10.1088/3050-2454/ae5498