Method for Testing the Radiation Resistance of Semiconductor Electronics Materials in an Electron Microscope
V. A. Kiselevskii; A. A. Tatarintsev
- Published
- Publisher
- Pleiades Publishing Ltd
- Journal / collection
- Russian Microelectronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1134/s1063739725600694
The original publisher provides the full text and its access options.
Cite this source
V. A. Kiselevskii; A. A. Tatarintsev. Method for Testing the Radiation Resistance of Semiconductor Electronics Materials in an Electron Microscope. Russian Microelectronics. 2025-10. https://doi.org/10.1134/s1063739725600694