Coexistence of Ohmic Contact and Fermi Level Pinning at 2D Electride/2D Semiconductor Interfaces
Chengfeng Pan; Dazhong Sun; Zhennan Lin; Xianghong Niu; Yu-Ning Wu
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Journal of the American Chemical Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/jacs.5c18589
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Cite this source
Chengfeng Pan; Dazhong Sun; Zhennan Lin; Xianghong Niu; Yu-Ning Wu. Coexistence of Ohmic Contact and Fermi Level Pinning at 2D Electride/2D Semiconductor Interfaces. Journal of the American Chemical Society. 2026-01-01. https://doi.org/10.1021/jacs.5c18589