Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Automated On-Wafer Radio-Frequency Transistor Characterization with Adaptive Probing and Features Extraction with Uncertainties

Alessandro Chillico; Domenico Vitali; Wojciech Samek; Olof Bengtsson

Published
Publisher
IEEE
Journal / collection
2025 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/inmmic64198.2025.10975516

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Alessandro Chillico; Domenico Vitali; Wojciech Samek; Olof Bengtsson. Automated On-Wafer Radio-Frequency Transistor Characterization with Adaptive Probing and Features Extraction with Uncertainties. 2025 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC). 2025-04-10. https://doi.org/10.1109/inmmic64198.2025.10975516

Download RIS