Computer Vision Systems for Defect Detection in Semiconductor Fabrication
Ganesh Pambala
- Published
- Publisher
- Tejass Publishers
- Journal / collection
- IJIREEICE
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.17148/ijireeice.2022.101222
The original publisher provides the full text and its access options.
Cite this source
Ganesh Pambala. Computer Vision Systems for Defect Detection in Semiconductor Fabrication. IJIREEICE. 2026-01-08. https://doi.org/10.17148/ijireeice.2022.101222